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Realising the Future of X-ray Detectors

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date_range 04 - 7 February, 2020

iCT Conference 2020

location_on Wels Campus, University of Applied Sciences, Upper Austria

error_outline First floor

Meet our Industrial Sales Leaders for Direct Conversion, Dr Daniel Odili and Eckhard Sperschneider to learn more about our photon counting X-ray imaging detectors.

This event brings together an impressive series of expert presentations about the latest developments, as well as established methods, of industrial X-ray computed tomography (CT). CT is a non-destructive method for measuring components 3-dimensionally in order to find hidden features (e.g. shrink-holes, cracks, inclusions, pores, etc.) in the depth of a material and to determine physical variables like porosity and density. CT allows the inspection and measurement of hidden and inaccessible specimen characteristics, which is not possible with other techniques.

 

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Videos

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Dual Energy
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Time Delay Summation
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Photon counting and charge integration technologies
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