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Technology for Industrial

Sharper Images, Optimum Resolution

X-ray Technology for Quality Control

The XC-TDI and XC-Thor range have been designed with low dose sensitivity and super-fast imaging to provide the ideal solution for DUPRO (During Production Check) and FATP (Final Assembly Test and Pack).

XC-TDI is the fastest dual-energy photon counting detector on the market, exceeding 10,000 lps with 100 micron resolution. Our customers know that this superior performance will deliver the essential level of detail they rely on for the highest standards of quality control.

By attributing each single photon signal to the correct pixel, the XC-Thor’s anti-coincidence technology means sharper images and better resolution, making the Thor the optimum inspection tool for any manufacturer.

We value our successful relationships in the manufacturing sector and demonstrate this by staying responsive to the evolving demands of process-line inspection and continuing to develop outstanding detection solutions.



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The XC-THOR series detectors are specifically designed for applications requiring solutions that are robust and radiation hard.


The direct conversion CdTe technology of these detectors bring the benefits of high sensitivity to industrial applications, along with the image sharpness intrinsic to photon counting. With dual energy capability, the XC-Thor additionally enables selective energy imaging, providing powerful removal of low energy scatter radiation. The superior radiation hardness of CdTe compared to scintillator detectors sets new standards in detector lifetime.

check1000 fps at 100 micron resolution checkUnsurpassed levels of MTF and DQE checkUp to 300 kV, more with ultra-high kV options


The XC-TDI series detector is the fastest, dual energy, photon counting industrial detector on the market.


Ideal for line scan applications which demand high speed inspection and material discrimination, the cadmium telluride (CdTe) photon counting technology enables high resolution imaging at fast speed with the ability to differentiate between subject materials. The unrivalled sensitivity, combined with efficient TDI scanning, maximises the use of available X-rays in generating high quality images thereby decreasing X-ray tube power requirements. The superior radiation hardness of CdTe compared to scintillator detectors sets new standards in detector lifetime.


The basic component in our detectors is a direct conversion material, which converts the x-rays into electrical signals, and a CMOS (ASIC) which transforms the electrical signals into a data stream of either the integrated electrical charge or the number of photons which has entered each pixel. This data is then used to create a digital image which is either two- or three-dimensional, depending on the scan geometry.

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