Menu menu

Close close

Visit us at European Congress of Radiology

The European Congress of Radiology

Read more

FAQ

We have the answers to your question.

To the FAQ

Our People

Knowledge is at the heart of our values.

Our people

Insights

Direct conversion – compared to indirect conversion.

Insights from DC

News

The latest happenings in and around Direct Conversion.

Our news

Events

Upcoming Events and Exhibitions.

Read more

Investor info

Information for investors and stakeholders.

Read more

Youtube videos

Subscribe to our youtube channel.

Visit Youtube launch

Twitter

Follow on us twitter, or give us a tweet.

Give us a tweet launch

Technology for Security

Fast Imaging for Swift Detection

Technology to Ensure International Security

The XC-TDI is at the forefront of the new technologies tackling increased threats to passenger safety worldwide. Its rapid imaging speed compared to other X-ray detectors make the XC-TDI an essential addition to international security systems where critical decisions have to be made fast. The dual energy capability allows for highly refined levels of material discrimination, ensuring hazardous substances can be swiftly detected and intercepted.

With safety as a priority, the low-dose XC-TDI is kinder to passenger health while also protecting electronic possessions from damage.

Products

XC-TDI

Read more

Solutions

XC-TDI

The XC-TDI series detector is the fastest dual energy, photon counting industrial detector on the market.

 

Ideal for line scan applications which demand high speed inspection and material discrimination, the cadmium telluride (CdTe) photon counting technology enables high resolution imaging at fast speed with the ability to differentiate between subject materials. The unrivalled sensitivity, combined with efficient TDI scanning, maximises the use of available X-rays in generating high quality images thereby decreasing X-ray tube power requirements. The superior radiation hardness of CdTe compared to scintillator detectors sets new standards in detector lifetime.

Technology

The basic component in our detectors is a direct conversion material, which converts the X-rays into electrical signals, and a CMOS (ASIC) which transforms the electrical signals into a data stream of either the integrated electrical charge or the number of photons which has entered each pixel. This data is then used to create a digital image which is either two- or three-dimensional, depending on the scan geometry.

Our Technology arrow_right_alt