Here you will find the latest happenings and insights in and around Direct Conversion.
August 24, 2017
During the conversion process of the X-ray photon, it is possible that charge is released between two or more pixels on the ASIC. Without correction, the photon counting technology may count two or more pixels for a single incoming X-ray photon event.
Additionally, materials can generate their own X-rays in a fluorescence type phenomenon. This effect occurs when materials interact with incident electrons with energies that match the requirements for stimulation of their K-shell electrons. These X-rays in turn will form secondary e-h pairs resulting in additional charge that may be measured in two or more pixels.
The above mechanisms may result in an effective “splash” of charge over several adjacent pixels.
Our proprietary Charge sharing correction/Anti-coincidence technology (CSC) corrects for this “splash” effect.
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