SNAP 225

Dental sensor (panoramic, cephalometric). The SNAP 225 sensor is designed for dental X-ray imaging systems in both panoramic and cephalometric modalities and in fixed as well as moveable sensor configurations.

The unparalleled imaging performance produced by the CdTe-CMOS technology is coupled with industry standard Gigabit Ethernet interface and flexible software solutions.

Performance & Sensor

Imaging parameters and performance1 Environmental conditions2 Electrical interface3 Software4

Pixel technology

Charge integration

Frame rate

300 fps

MTF @ RQA5:

>70 % @ 2 lp/mm, >30 % @ 5 lp/mm

Sensor thickness

0.75 mm CdTe

Active area size

6.4 mm x 151.0 mm (panoramic modality)
6.4 mm x 226.6 mm (cephalometric modality)

DQE @ RQA5:

>80 % @ 0 lp/mm >60 % @ 2 lp/mm, >20 % @ 5 lp/mm

Pixel size

100 µm x 100 µm

Pixel depth @ 300 fps

12-bit

Scanning speed

≤30 mm/s at sensor plane

Operating temperature range speed

+10 to +40 °C

Transportation temperature range

-30 to +50 °C (max 2 days)

Operating relative humidity

30 % – 75 %

Storage temperature range

+5 to +45 °C

Data interface

1000BASE– T Ethernet

Interface

Optoisolated I/O (5 V)

Power supply

24 V, 10 W

Software included

Imaging application & software development kit

Supported operating systems

Windows 7-10 32-bit and 64-bit

Technology

The basic component in our detectors is a direct conversion material, which converts the X-rays into electrical signals, and a CMOS (ASIC) which transforms the electric signals into a data stream of either the integrated electric charge or the number of photons which has entered each pixel. This data is then used to create a digital image which is either two- or three-dimensional, depending on the scan geometry.

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