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The XC-TDI series detector is a fast, dual energy, photon counting industrial detector.

Ideal for line scan applications which demand high speed inspection and material discrimination, the cadmium telluride (CdTe) photon counting technology enables high resolution imaging at fast speed with the ability to differentiate between subject materials. Its sensitivity, combined with efficient TDI scanning, maximises the use of available X-rays in generating high quality images thereby decreasing X-ray tube power requirements. The radiation hardness of CdTe offers the additional benefit of extending detector lifetime.

All Varex/Direct Conversion imaging receptors are designed to be integrated into a complete X-ray system by a qualified system integrator. The system integrator is responsible for obtaining FDA clearance for medical use or appropriate CE marking.
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Performance & Sensor

Pixel technology

Photon counting

Pixel size

100 μm

X-ray energy range

10 kVp to 160 kVp (standard energy)
20 kVp to 300 kVp (high energy)


80 % @ 2lp/mm, 45 % @ 5lp/mm,


<0.1 % 1 min after X-rays (6μGy)

Energy discrimination

Single energy /dual energy threshold

Pixel fill factor

100 %

Active sensor area

6 mm wide
100 mm to 700 mm length

DQE (0)

>80 % RQA5 spectra, 6μGy, SID 1m

Sensor material and thickness

Cadmium telluride (CdTe) : 0.75 mm (standard energy)
Cadmium telluride (CdTe) : 2.0 mm (high energy)

Tile gap

100 μm

Imaging speed

Up to 20,000 lines per sec (2m/s)


0 % (after X-ray 6μGy)

Data Interface


Power supply

External 12 VDC power supply

External trigger

Opto coupled 5 V, 12-24 V with external resistor

Operating temperature range

+10 to +30 ℃ @ 30 % to 75 % humidity
+10 to +35 ℃ @ 30 % to 55 % humidity
+10 to +40 ℃ @ 30 % to 45 % humidity

Temperature control

Internal Peltier temperature control

Storage temperature range

+5 to +50 °C

Software GUI included

Fully flexible SDK included

Supported operating systems

Windows 7 onwards